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3.3V PECL Low Jitter XO
SN
SN Series Crystal Clock Oscillator (XO)
Legacy SEL383 Series | 7.0 x 5.0mm
Test Circuit
Test Point
+2V
(Termination
internal to scope)
0.1 μ F
0.01 μ F
6
5
4
50
50
-1.3V
1
2
3
0.1 μ F
0.01 μ F
Output Enable/Disable Function
(OE function present on specified pin)
Re ? ow Soldering Pro ? le
As per IPC/JEDEC J-STD-020C
260
1 to 3°C/sec max
Peak 260°C for 10 sec max
1 to 3°C/sec
217
Time
60 to 90 sec
4 to 6 minutes max
Reliability Test Ratings
This product is rated to meet the following test conditions:
Type
Mechanical
Mechanical
Mechanical
Mechanical
Mechanical
Mechanical
Environmental
Environmental
Environmental
Environmental
Parameter
Shock
Solderability
Terminal strength
Gross leak
Fine leak
Solvent resistance
Thermal shock
Moisture resistance
Vibration
Resistance to soldering heat
Test Condition
MIL-STD-883, Method 2002, Condition B
JESD22-B102-D Method 2 (Preconditioning E)
MIL-STD-883, Method 2004, Condition D
MIL-STD-883, Method 1014, Condition C
MIL-STD-883, Method 1014, Condition A2 (R 1 = 2x10 -8 atm cc/s)
MIL-STD-202, Method 215
MIL-STD-883, Method 1011, Condition A
MIL-STD-883, Method 1004
MIL-STD-883, Method 2007, Condition A
J-STD-020C Table 5-2 Pb-free devices (2 cycles max)
SaRonix-eCera? is a Pericom? Semiconductor company
?
US: +1-408-435-0800 TW: +886-3-4518888
?
www.saronix-ecera.com
All specifications are subject to change without notice.
SN 3.3V REV2009_JAN26_01.7
4
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